Asymmetric aging effect on modern microprocessors
نویسندگان
چکیده
Reliability, a crucial requirement in any modern microprocessor, assures correct execution over its lifetime. As mission critical components are becoming common commodity systems, e.g., control of autonomous cars, the demand for reliable processing continues to grow. The latest process technologies have aggravated situation by causing microprocessors be highly vulnerable reliability concerns. This paper examines asymmetric aging phenomenon, which is major worry advanced nodes. In this logical elements and memory cells suffer from unequal timing degradation their lifetimes and, consequently, raise Thus far, most studies approached circuit or physical design viewpoint, but these solutions were quite limited suboptimal. paper, we introduce an aging-aware microarchitecture that aims reduce phenomenon's impact. study mainly focused on following subsystems: units, register files hierarchy. Our experiments indicate proposed incur minimal overhead while significantly mitigating stress.
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ژورنال
عنوان ژورنال: Microelectronics Reliability
سال: 2021
ISSN: ['0026-2714', '1872-941X']
DOI: https://doi.org/10.1016/j.microrel.2021.114090